IEE5650: VLSI Testing

Assignment #0  (Due: Mar. 2, 2010)

last update: Feb.23, 2010


Reading:

(In the following, XXX is the identification number of the circuit, e.g., "27" is the identification number of s27.bench)

Homework Problems:

(100 pts) Get yourself familiar with the data structure of the podem test generation package (though we do not use the test generation parts yet). Please use the circuit parser to read benchmark circuits and then output the following attributes of the circuits. Choose benchmark circuits according to different criteria including combinational or sequential, optimized or non-optimized, larger or small circuits etc.