IEE5650: VLSI Testing

Assignment #0  (Due: Mar. 08, 2019 23:59:99)

Last update: 2019-02-21


Reading:

Homework Problems:

(100 pts) Get yourself familiar with the data structure of the podem test generation package (though we do not use the test generation parts yet). Please use the circuit parser to read benchmark circuits and then output the following attributes of the circuits. Choose benchmark circuits according to different criteria including combinational or sequential, optimized or non-optimized, larger or small circuits, etc.

Attention:

  1. The required command format is as follows:
    (So you are required to enroll a new option in main.cc.)
    ./atpg -ass0 [circuit_name]

  2. Example:
    ./atpg -ass0 c17.bench