EEIE30069: VLSI Testing

Assignment #0  (Due: Sep. 18, 2023 23:59:99)

Last update: 2023-09-06


Reading:

Assignment Description:

(100 pts) Get yourself familiar with the data structure of the podem test generation package (though we do not use the test generation part yet). Please use the circuit parser to read benchmark circuits and then output the following attributes of a circuit. Choose benchmark circuits according to different criteria including combinational, sequential, optimized ,and non-optimized, larger or small circuits, etc.

Attention:

  1. The required command format is as follows:
    (So you are required to enroll a new option in main.cc.)
    ./atpg -ass0 [circuit_name]
  2. Example:
    ./atpg -ass0 c17.bench