Publications

Referred Conference / Journal Papers

2025

Test Methodology for Detecting Defect-Based Hold-Time Faults

C.-H. Tsai, Y.-T. Nien, G.-Y. Chen and M. C.-T. Chao

IEEE VTS 2025

COPA: A Congestion-Oriented Pin Assignment Framework for Intra-Block Physical Design Optimization

S.-Y. Tsai et al.

IEEE/ACM ICCAD 2025

2024

Arbitrary-size Multi-layer OARSMT RL Router Trained with Combinatorial Monte-Carlo Tree Search

Liang-Ting Chen, Hung-Ru Kuo, Yih-Lang Li, and Mango C.-T. Chao

ACM/IEEE DAC 2024

Transformer and Its Variants for Identifying Good Dice in Bad Neighborhoods

Cheng-Che Lu, Chi-Chih Chang, Chia-Heng Yen, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu and Mango Chia-Tso Chao

IEEE VTS 2024

Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks

Chia-Heng Yen, Ting-Rui Wang, Ching-Min Liu, Cheng-Hao Yang, Chun-Teng Chen, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu and Mango Chia-Tso Chao

IEEE Transactions on Semiconductor Manufacturing

2023

Outlier Detection for Analog Tests Using Deep Learning Techniques

Chin-Kuan Lin, Cheng-Che Lu, Shuo-Wen Chang, Ying-Hua Chu, Kai-Chiang Wu, Mango Chia-Tso Chao

Best Paper Award IEEE VTS 2023

CNN-Based Stochastic Regression for IDDQ Outlier Identification

Chia-Heng Yen, Chun-Teng Chen, Cheng-Yen Wen, Ying-Yen Chen, Jih-Nung Lee , Shu-Yi Kao, Kai-Chiang Wu and Mango Chia.-Tso. Chao

IEEE TCAD 2023

DRC Violation Prediction after Global Route Through Convolutional Neural Network

Wei-Tse Hung, Yu-Guang Chen, Jhen-Gang Lin, Cheng-Hong Tsai and Mango C.-T. Chao

IEEE TVLSI 2023

DRC Violation Prediction with Pre-global-routing Features Through Convolutional Neural Network

Jhen-Gang Lin, Yu-Guang Chen, Yun-Wei Yang, Wei-Tse Hung, Cheng-Hong Tsai, De-Shiun Fu and Mango C.-T. Chao

ACM GLVLSI 2023

Enhancing Good-Die-in-Bad-Neighborhood Methodology with Wafer-Level Defect Pattern Information

Ching-Min Liu, Chia-Heng Yen, Shu-Wen Lee, Kai-Chiang Wu, and Mango C.-T. Chao

IEEE ITC 2023

Test Generation for Defect-Based Faults of Scan Flip-Flops

Yu-Teng Nien, Chen-Hong Li, Pei-Yin Wu, Yung-Jheng Wang, Kai-Chiang Wu, Mango C.-T. Chao

IEEE VTS 2023

2022

Improving Cell-Aware Test for Intra-Cell Short Defects

Dong-Zhen Lee, Ying-Yen Chen, Kai-Chiang Wu, Mango C.-T. Chao

DATE 2022

A Reinforcement Learning Agent for Obstacle-Avoiding Rectilinear Steiner Tree Construction

Po-Yan Chen, Bing-Ting Ke, Tai-Cheng Lee, I-Ching Tsai, Tai-Wei Kung, Li-Yi Lin, En-Cheng Liu, Yun-Chih Chang, Yih-Lang Li, Mango C.-T. Chao

ISPD 2022

Path-Based Pre-Routing Timing Prediction for Modern Very Large-Scale Integration Designs

Li-Wei Chen, Yao-Nien Sui, Tai-Cheng Lee, Yih-Lang Li, Mango C.-T. Chao, I-Ching Tsai, Tai-Wei Kung, En-Cheng Liu, Yun-Chih Chang

ISQED 2022

Test Methodology for Defect-Based Bridge Faults

Shuo-Wen Chang, Yu-Teng Nien, Yu-Pang Hu, Kai-Chiang Wu, Chi-Chun Wang, Fu-Sheng Huang, Yi-Lun Tang, Yung-Chen Chen, Ming-Chien Chen, Mango C.-T. Chao

IEEE TVLSI 2022

Rule Generation for Classifying SLT Failed Parts

Ho-Chieh Hsu, Cheng-Che Lu, Shih-Wei Wang, Kelly Jones, Kai-Chiang Wu and Mango C.-T. Chao

IEEE VTS 2022

2021

Methodology of Generating Timing-Slack-Based Cell-Aware Tests

Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao

IEEE TCAD 2021

Identifying Good-Dice-in-Bad-Neighborhoods Using Artificial Neural Networks

Cheng-Hao Yang, Chia-Heng Yen, Ting-Rui Wang, Chun-Teng Chen, Mason Chern, Ying-Yen Chen, Jih-Nung Lee, Shu-Yi Kao, Kai-Chiang Wu, Mango Chia-Tso Chao

IEEE VTS 2021

2020

Nominee

Transforming Global Routing Report into DRC Violation Map with Convolutional Neural Network

Best Paper Nominee

Wei-Tse Hung, Jun-Yang Huang, Yih-Chih Chou, Cheng-Hong Tsai, Mango Chao

ISPD 2020

Power Distribution Network Generation for Optimizing IR-Drop Aware Timing

Wen-Hsiang Chang, Li-Yi Lin, Yu-Guang Chen, Mango C.-T. Chao

IEEE/ACM ICCAD 2020

CNN-based Stochastic Regression for IDDQ Outlier Identification

Chun-Teng Chen, Chia-Heng Yen, Cheng-Yen Wen, Cheng-Hao Yang, Kai-Chiang Wu, Mason Chern, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee, Shu-Yi Kao, Mango Chia-Tso Chao

IEEE VTS 2020

2019

Methodology of Generating Timing-Slack-Based Cell-Aware Tests

Yu-Teng Nien, Kai-Chiang Wu, Dong-Zhen Lee, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao, and Mango C.-T. Chao

IEEE ITC 2019

Micro-Architecture Optimization for Low-Power Bitcoin Mining ASICs

Y.-Z. Wang, J. Wu, S.-H. Chen, Mango C.-T. Chao, and C.-H. Yang

IEEE VLSI-DAT 2019

Layout-Based Dual-Cell-Aware Tests

Tse-Wei Wu, Dong-Zhen Lee, Kai-Chiang Wu, Yu-Hao Huang, Ying-Yen Chen, Po-Lin Chen, Mason Chern, Jih-Nung Lee, Shu-Yi Kao and Mango C.-T. Chao

IEEE VTS 2019

2018

A Model-Based-Random-Forest Framework for Predicting Vt Mean and Variance Based on Parallel Id Measurement

Chien-Hsueh Lin, Chih-Ying Tsai, Kao-Chi Lee, Sung-Chu Yu, Wen-Rong Liau, Alex Chun-Liang Hou, Ying-Yen Chen, Chun-Yi Kuo, Jih-Nung Lee and Mango C.-T. Chao

IEEE TCAD 2018

DVFS Binning Using Machine-Learning Techniques

Keng-Wei Chang, Chun-Yang Huang, Szu-Pang Mu, Jian-Min Huang, Shi-Hao Chen, Mango C.-T. Chao

IEEE ITC-Asia 2018